Publication: Welcome to the IEEE OPEN JOURNAL OF THE SOLID-STATE CIRCUITS SOCIETY (OJ-SSCS)
Welcome to the IEEE OPEN JOURNAL OF THE SOLID-STATE CIRCUITS SOCIETY (OJ-SSCS)
cris.virtual.author-scopus | 6603792591 | |
cris.virtual.department | AQUA | |
cris.virtual.parent-organization | IEM | |
cris.virtual.parent-organization | STI | |
cris.virtual.parent-organization | EPFL | |
cris.virtual.sciperId | 146991 | |
cris.virtual.unitId | 12178 | |
cris.virtual.unitManager | Charbon, Edoardo | |
cris.virtualsource.author-scopus | 0e01dc62-9c4a-4f9c-8c84-638a24d0f55d | |
cris.virtualsource.department | 0e01dc62-9c4a-4f9c-8c84-638a24d0f55d | |
cris.virtualsource.orcid | 0e01dc62-9c4a-4f9c-8c84-638a24d0f55d | |
cris.virtualsource.parent-organization | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
cris.virtualsource.parent-organization | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
cris.virtualsource.parent-organization | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
cris.virtualsource.parent-organization | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
cris.virtualsource.rid | 0e01dc62-9c4a-4f9c-8c84-638a24d0f55d | |
cris.virtualsource.sciperId | 0e01dc62-9c4a-4f9c-8c84-638a24d0f55d | |
cris.virtualsource.unitId | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
cris.virtualsource.unitManager | d74be593-dcf3-4e4d-a5ed-9d0304f2831c | |
datacite.rights | openaccess | |
dc.contributor.author | Aflatouri, Firooz | |
dc.contributor.author | Breems, Lucien | |
dc.contributor.author | Charbon, Edoardo | |
dc.contributor.author | Fan, Qinwen | |
dc.contributor.author | Hashemi, Hossein | |
dc.contributor.author | Liscidini, Antonio | |
dc.contributor.author | Rhee, Woogeun | |
dc.contributor.author | Rusu, Stefan | |
dc.contributor.author | Seo, Jae-sun | |
dc.contributor.author | Yoo, Jerald | |
dc.contributor.author | Wilcox, Kathy | |
dc.contributor.author | Cantatore, Eugenio | |
dc.date.accessioned | 2025-01-27T16:27:41Z | |
dc.date.available | 2025-01-27T16:27:41Z | |
dc.date.created | 2025-01-27 | |
dc.date.issued | 2021-01-01 | |
dc.date.modified | 2025-01-27T16:27:44.937713Z | |
dc.description.sponsorship | AQUA | |
dc.identifier | 10.1109/OJSSCS.2021.3108267 | |
dc.identifier.doi | 10.1109/OJSSCS.2021.3108267 | |
dc.identifier.isi | WOS:001355888600001 | |
dc.identifier.uri | ||
dc.language.iso | English | |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
dc.relation.ispartof | IEEE OPEN JOURNAL OF THE SOLID-STATE CIRCUITS SOCIETY | |
dc.relation.issn | 2644-1349 | |
dc.relation.journal | IEEE Open Journal Of The Solid-state Circuits Society | |
dc.title | Welcome to the IEEE OPEN JOURNAL OF THE SOLID-STATE CIRCUITS SOCIETY (OJ-SSCS) | |
dc.type | text::journal::editorial | en |
dspace.entity.type | Publication | |
dspace.file.type | main document | |
epfl.peerreviewed | REVIEWED | |
epfl.workflow.startDateTime | 2025-01-27T12:30:08.570Z | |
epfl.writtenAt | EPFL | |
local.wos.sourceType | Editorial Material | |
oaire.citation.edition | WOS.ESCI | |
oaire.licenseCondition | CC BY | |
oaire.version | ||
oairecerif.author.affiliation | University of Pennsylvania | |
oairecerif.author.affiliation | NXP Semiconductors | |
oairecerif.author.affiliation | École Polytechnique Fédérale de Lausanne | |
oairecerif.author.affiliation | Delft University of Technology | |
oairecerif.author.affiliation | University of Southern California | |
oairecerif.author.affiliation | University of Toronto | |
oairecerif.author.affiliation | Tsinghua University | |
oairecerif.author.affiliation | TSMC North Amer | |
oairecerif.author.affiliation | Arizona State University | |
oairecerif.author.affiliation | National University of Singapore | |
oairecerif.author.affiliation | AMD | |
oairecerif.author.affiliation | Eindhoven University of Technology | |
person.identifier.rid | LXC-0416-2024 | |
person.identifier.rid | IBH-5305-2023 | |
person.identifier.rid | GCI-8705-2022 | |
person.identifier.rid | EXU-4662-2022 | |
person.identifier.rid | EZH-3310-2022 | |
person.identifier.rid | LTC-4768-2024 | |
person.identifier.rid | IAG-5078-2023 | |
person.identifier.rid | DRC-6068-2022 | |
person.identifier.rid | FXF-2208-2022 | |
person.identifier.rid | LMC-8806-2024 | |
person.identifier.rid | EFR-6632-2022 | |
person.identifier.rid | EOQ-4440-2022 |