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  4. Indexing Protected Deep Face Templates by Frequent Binary Patterns
 
conference paper

Indexing Protected Deep Face Templates by Frequent Binary Patterns

Osorio-Roig, Daile
•
Rathgeb, Christian
•
Shahreza, Hatef Otroshi
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January 1, 2022
2022 Ieee International Joint Conference On Biometrics (Ijcb)
IEEE International Joint Conference on Biometrics (IJCB)

In this work, we present a simple biometric indexing scheme which is binning and retrieving cancelable deep face templates based on frequent binary patterns. The simplicity of the proposed approach makes it applicable to unprotected as well as protected, i.e. cancelable, deep face templates. As such, this approach represents to the best of the authors' knowledge the first generic indexing scheme that can be applied to arbitrary cancelable face templates (of binary representation). In experiments, deep face templates are obtained from the Labelled Faces in the Wild (LFW) dataset using the ArcFace face recognition system for feature extraction. Protected templates are then generated by employing different cancelable biometric schemes, i.e. BioHashing and two variants of Index-of-Maximum Hashing. The proposed indexing scheme is evaluated on closed- and open-set identification scenarios. It is shown to maintain the recognition accuracy of the baseline system while reducing the penetration rate and hence the workload of identifications to approximately 40%.

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Type
conference paper
DOI
10.1109/IJCB54206.2022.10007939
Web of Science ID

WOS:000926877700011

Author(s)
Osorio-Roig, Daile
Rathgeb, Christian
Shahreza, Hatef Otroshi
Busch, Christoph
Marcel, Sebastien  
Date Issued

2022-01-01

Publisher

IEEE

Publisher place

New York

Published in
2022 Ieee International Joint Conference On Biometrics (Ijcb)
ISBN of the book

978-1-6654-6394-2

Subjects

Computer Science, Artificial Intelligence

•

Imaging Science & Photographic Technology

•

Computer Science

•

cancelable biometrics

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LIDIAP  
Event nameEvent placeEvent date
IEEE International Joint Conference on Biometrics (IJCB)

Abu Dhabi, U ARAB EMIRATES

Oct 10-13, 2022

Available on Infoscience
March 13, 2023
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/195840
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