Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Advances, Challenges and Opportunities in 3D CMOS Sequential Integration
 
conference paper

Advances, Challenges and Opportunities in 3D CMOS Sequential Integration

Batude, P.
•
Vinet, M.
•
Previtali, B.
Show more
2011
Proceedings of the IEEE International Electron Devices Meeting (IEDM)
IEEE International Electron Devices Meeting (IEDM)

3D sequential integration enables the full use of the third dimension thanks to its high alignment performance. In this paper, we address the major challenges of 3D sequential integration: in particular, the control of molecular bonding allows us to obtain pristine quality top active layer. With the help of Solid Phase Epitaxy, we can match the performance of top FET, processed at low temperature (600°C), with the bottom FET devices. Finally, the development of a stable salicide enables to retain bottom performance after top FET processing. Overcoming these major technological issues offers a wide range of applications.

  • Files
  • Details
  • Metrics
Loading...
Thumbnail Image
Name

IEDM 2011_Shashi.pdf

Access type

openaccess

Size

1.39 MB

Format

Adobe PDF

Checksum (MD5)

9f1db1f9625e374ad035107da284d6c2

Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés