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  4. Fabrication of nanoelectrodes combining standard microfabrication processes and focused ion beam (FIB)
 
conference poster not in proceedings

Fabrication of nanoelectrodes combining standard microfabrication processes and focused ion beam (FIB)

Errachid, A.
•
Martinez, E.
•
Villanueva, G.  
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2004
Trends in Nanotechnology (TNT)

We present a method for the production of nanoelectrodes using focussed ion beam techniques (FIB). The electrodes utilise nanometric holes milled in a silicon nitride based pasivation layer, followed by wet etching of a silicon oxide based pasivation layer, to expose an underlying gold electrode. After functionalisation using a surface assembled monolayer and an electrochemically grown polypyrrole, these gold nanoelectrodes have been tested, via cyclic voltammetry, in the detection of [Fe(CN)6]4-/3- ions. The nanoelectrodes will be used to investigate the electrical properties of nanometric biological specimen.

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Type
conference poster not in proceedings
Author(s)
Errachid, A.
•
Martinez, E.
•
Villanueva, G.  
•
Bausells, J.
•
Samitier, J.
Date Issued

2004

Subjects

Nanoelectrodes

•

Focused ion beam

•

Cyclic voltammetry

•

Polypyrrole

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
NEMS  
Event nameEvent placeEvent date
Trends in Nanotechnology (TNT)

Segovia

2004

Available on Infoscience
August 6, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/93805
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