Kühn, JonasColomb, TristanPache, ChristopheCharrière, FlorianMontfort, FrédéricCuche, EtienneEmery, YvesMarquet, PierreDepeursinge, Christian2009-07-202009-07-202009-07-20200810.1117/12.763291https://infoscience.epfl.ch/handle/20.500.14299/41652WOS:000256378900013We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single- wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.[MVD]text::conference output::conference proceedings::conference paper