Weisbuch, C.Houdré, R.Stanley, R.P.2007-08-312007-08-312007-08-31199610.1088/0031-8949/1996/T66/019https://infoscience.epfl.ch/handle/20.500.14299/11210WOS:A1996WD64300020Recent progress in semiconductor microcavitiestext::journal::journal article::research article