Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures

Buffat, Philippe-AndréGanière, Jean-DanielStadelmann, Pierre2019-07-042019-07-042019-07-04198910.1007/978-1-4613-0527-9_23https://infoscience.epfl.ch/handle/20.500.14299/158833Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structurestext::conference output::conference proceedings::conference paper