Latychevskaia, TatianaWoods, Colin RobertWang, Yi BoHolwill, MatthewPrestat, EricHaigh, Sarah J.Novoselov, Kostya S.2020-05-202020-05-202020-05-202020-05-0110.1016/j.ultramic.2020.112976https://infoscience.epfl.ch/handle/20.500.14299/168831WOS:000529312300008Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED can be applied for imaging two-dimensional (2D) crystals where a direct reconstruction is possible and three-dimensional crystal deformations at a nanometre resolution can be retrieved. Here, we demonstrate that second-order effects allow for further information to be obtained regarding stacking arrangements between the crystals. Such effects are especially pronounced in samples consisting of multiple layers of 2D crystals. We show, using simulations and experiments, that twisted multilayer samples exhibit extra modulations of interference fringes in CBED patterns, i. e., a CBED moire. A simple and robust method for the evaluation of the composition and the number of layers from a single-shot CBED pattern is demonstrated.Microscopygraphenetwisted bilayer graphenemultilayer graphenevan der waals structurestransmission electron microscopyconvergent beam electron diffractionsingle-layerthicknessmos2text::journal::journal article::research article