Miazza, C.Dunand, S.Wyrsch, N.Shah, A.Blanc, N.Kaufmann, R.Cavalier, L.2009-02-102009-02-10200410.1557/PROC-808-A4.46https://infoscience.epfl.ch/handle/20.500.14299/35075Performance analysis of a-Si:H detectors deposited on CMOS chipstext::conference output::conference proceedings::conference paper