Weisen, H.Pasini, D.Weller, A.Edwards, A.W.2008-04-162008-04-162008-04-16199110.1063/1.1142482https://infoscience.epfl.ch/handle/20.500.14299/21144JETMeasurement of light impurity densities and Zeff in JET using X-ray tomographytext::journal::journal article::research article