Distribution of Vt of Dual FETs in View of their Application to Differential Measurements with ISFET-MAOSFET Pairs

Hu, B.van den Vlekkert, H. H.de Rooij, N. F.2009-05-122009-05-122009-05-121990https://infoscience.epfl.ch/handle/20.500.14299/39407Distribution of Vt of Dual FETs in View of their Application to Differential Measurements with ISFET-MAOSFET Pairstext::journal::journal article::research article