Guo, ZDAmbrosio, FChen, WGono, PPasquarello, A2018-11-082018-11-082018-11-08201810.1021/acs.chemmater.7b02619https://infoscience.epfl.ch/handle/20.500.14299/149832WOS:000419999400010Alignment of Redox Levels at Semiconductor-Water Interfacestext::journal::journal article::research article