Rucavado, EGrauzinyte, MFlores-Livas, JAJeangros, QLanducci, FLee, YKoida, TGoedecker, SHessler-Wyser, ABallif, CMorales-Masis, M2018-11-082018-11-082018-11-08201810.1021/acs.jpcc.8b02302https://infoscience.epfl.ch/handle/20.500.14299/150645WOS:000441484600004New Route for "Cold-Passivation" of Defects in Tin-Based Oxidestext::journal::journal article::research article