Oliva, NicolòIlarionov, Yury YuCasu, Emanuele AndreaCavalieri, MatteoKnobloch, TheresiaGrasser, TiborIonescu, Mihai Adrian2020-01-242020-01-242020-01-242019-08-0710.1109/JEDS.2019.2933745https://infoscience.epfl.ch/handle/20.500.14299/164897Hysteresis Dynamics in Double-Gated n-Type WSe2 FETs With High-k Top Gate Dielectrictext::journal::journal article::research article