Vaccaro, L.Aeschlimann, L.Akiyama, T.Eckert, R.Heinzelmann, H.de Rooij, N. F.Stauffer, U.Herzig, H. P.2009-04-222009-04-222009-04-22200210.1109/OMEMS.2002.1031417https://infoscience.epfl.ch/handle/20.500.14299/37857Theoretical and experimental characterization of fully metal coated scanning near-field optical microscopy SiO2 Tipstext::conference output::conference proceedings::conference paper