Meley, HKarandeepOberson, Lde Bruijckere, JAlexander, DTLTriscone, JMGhosez, PGariglio, S2018-11-082018-11-082018-11-08201810.1063/1.5037455https://infoscience.epfl.ch/handle/20.500.14299/151007WOS:000436859000013Structural analysis of LaVO3 thin films under epitaxial strain (vol 6, 046102, 2018)text::journal::journal article::research article