Gautsch, S.Staufer, U.Akiyama, T.Hidber, H.-R.Tonin, A.Howald, L.Müller, D.de Rooij, N. F.2009-05-122009-05-122009-05-122003https://infoscience.epfl.ch/handle/20.500.14299/39283Technological and Scientific challenges of Atomic Force Microscopy on Marstext::conference output::conference proceedings::conference paper