Sheppard, Colin J. R.Castello, MarcoTortarolo, GiorgioZunino, AlessandroSlenders, EliBianchini, PaoloVicidomini, GiuseppeDiaspro, Alberto2023-07-032023-07-032023-07-032023-05-2210.3390/photonics10050601https://infoscience.epfl.ch/handle/20.500.14299/198729WOS:001011310700001We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two-photon microscopy with a detector array increases the peak intensity of the point spread function. The outer pixels of a detector array give signals from defocused regions, and thus the processing of these, such as through subtraction, can further improve optical sectioning and background rejection.Opticsconfocal microscopytwo-photon microscopyimage scanning microscopypixel reassignmentexcitationresolutiondetectorpinholedepthsinglenoiselimittext::journal::journal article::research article