Nguyen, T. P.Thiery, L.Euphrasie, S.Lemaire, E.Khan, S.Briand, D.Aigouy, L.Gomes, S.Vairac, P.2019-06-232019-06-232019-06-232019-05-1410.1115/1.4043381https://infoscience.epfl.ch/handle/20.500.14299/158407Calibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Modetext::journal::journal article::research article