Montfort, FrédéricEmery, YvesSolanas, E.Cuche, EtienneAspert, NicolasMarquet, PierreJoris, ClaudeKühn, JonasDepeursinge, Christian2009-08-032009-08-032009-08-03200610.1117/12.716113https://infoscience.epfl.ch/handle/20.500.14299/41965[MVD]Surface roughness parameters measurements by Digital Holographic Microscopy (DHM)text::conference output::conference proceedings::conference paper