Handge, U. A.Leterrier, Y.Månson, J.-A. E.Sokolov, I. M.Blumen, A.2006-06-262006-06-262006-06-26199910.1209/epl/i1999-00478-8https://infoscience.epfl.ch/handle/20.500.14299/232231WOS:000083426500007An analysis of disorder in thin silicon oxide coatingstext::journal::journal article::research article