Blank, MaiteWeber, Ludger2019-04-282019-04-282019-04-282019-04-1410.1063/1.5096856https://infoscience.epfl.ch/handle/20.500.14299/156149WOS:000464451700052Physics, AppliedPhysicsErratum: Influence of the thickness of a nanometric copper interlayer on Au/dielectric thermal boundary conductance (vol 124, 105304, 2018)text::journal::journal article::research article