Bradley, A.L.Doran, J.P.Aherne, T.Hegarty, J.Stanlcy, R.P.Houdre, R.Oesterle, U.Hegems, M.2007-08-312007-08-312007-08-31199610.1109/EQEC.1996.561740https://infoscience.epfl.ch/handle/20.500.14299/11219Nonlinear Effectivity of Semiconductor Microcavities in the Strong-Coupling Regime: Experiment and Theorytext::conference output::conference proceedings::conference paper