Homsy, A.Rytka, C.Gobrecht, J.Pierer, J.Bosshard, C.de Rooij, N.F.2010-02-112010-02-112010-02-112009https://infoscience.epfl.ch/handle/20.500.14299/46612Fast Quality Control with Diffractive Micro-and Nanostructurestext::conference output::conference presentation