Dändliker, R.Zimmermann, E.Schnell, U.Salvadé, Y.2009-04-222009-04-222009-04-22199510.1007/978-3-642-80263-8_93https://infoscience.epfl.ch/handle/20.500.14299/37641Multiple-wavelength and white light interferometrytext::conference output::conference proceedings::conference paper