Gomez-Diaz, Juan SebastianMoldova, C.Capdevilla, S.Bernard, L. S.Romeu, J.Ionescu, Mihai AdrianMagrez, ArnaudPerruisseau-Carrier, Julien2015-08-112015-08-112015-08-112014https://infoscience.epfl.ch/handle/20.500.14299/116922Measurement of biased graphene stacks at terahertz: dynamic reconfiguration and hysteresistext::conference output::conference paper not in proceedings