Barolak, JonathanGoldberger, DavidSquier, JeffBellouard, YvesDurfee, CharlesAdams, Daniel2021-11-182021-11-18202210.1016/j.ultramic.2021.113418https://infoscience.epfl.ch/handle/20.500.14299/183048We present the first experimental demonstration of wavelength-multiplexing in single-shot ptychography. Specifically, we experimentally reconstruct the complex transmission profile of a wavelength-independent and wavelength-dependent object simultaneously for 532 nm and 633 nm probing wavelengths. In addition, we discuss the advantages of a more general approach to detector segmentation in single-shot ptychography. A minimization to correct for uncertainties in a priori information that is required for single-shot geometries is presented along with a novel probe constraint. Furthermore, this technique is complementary to dual-wavelength interferometry without the need for an external reference. This work is enabling to imaging technologies and applications such as broadband single-shot ptychography, time-resolved imaging by multiplexed ptychography, real-time inspection for laser micro-machining, and plasma imaging.Single-shot ptychographyInformation multiplexingCoherent diffraction imagingReference-freeQuantitative phase imagingtext::journal::journal article::research article