A method to determine the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Foeth, MStadelmann, PABuffat, PA2007-02-152007-02-152007-02-151998https://infoscience.epfl.ch/handle/20.500.14299/2929A method to determine the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopytext::conference output::conference proceedings::conference paper