A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain walls

Foeth, MSfera, ABuffat, PAStadelmann, PA2007-02-152007-02-152007-02-151998https://infoscience.epfl.ch/handle/20.500.14299/2926A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain wallstext::conference output::conference proceedings::conference paper