Thibault, PierreDierolf, MartinMenzel, AndreasBunk, OliverDavid, ChristianPfeiffer, Franz2008-07-212008-07-212008-07-21200810.1126/science.1158573https://infoscience.epfl.ch/handle/20.500.14299/27053WOS:00025771390004212717High-Resolution Scanning X-ray Diffraction Microscopytext::journal::journal article::research article