Roy, AbhijitParvin, ReajminaKarmakar, AnkitaMandal, AbhishekSingh, Rakesh KumarBrundavanam, Maruthi M.2024-04-172024-04-172024-04-172024-04-0110.1088/2040-8986/ad2ed9https://infoscience.epfl.ch/handle/20.500.14299/207210WOS:001183687000001A dual-shot technique based on the field basis addition of two statistically independent speckle patterns is developed to recover an input polarization through a scattering layer. It is proposed theoretically, and demonstrated both numerically and experimentally that by tuning the linear polarization orientation of the reference speckle pattern to 0 degrees and 45 degrees w.r.t. the x-axis, polarization retrieval of an object beam through a scattering layer can be achieved by measuring the degree of polarization of the superposed speckle pattern. The proposed technique can have a wide range of applications in polarization sensing and biomedical imaging.Physical SciencesPolarization RetrievalSpeckle CorrelationUncorrelated Speckle PatternsStokes ParametersPolarization EllipseSpeckle SuperpositionDegree Of Polarizationtext::journal::journal article::research article