Heuberger, M.Dietler, G.Strumpler, R.Rhyner, J.Isberg, J.2007-06-202007-06-202007-06-20199710.1063/1.365896https://infoscience.epfl.ch/handle/20.500.14299/9046Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontactstext::journal::journal article::research article