Free surface effects in TEM imaging of dislocation lines and loops in Fe

Hébert, CécileWu, Wenwang2014-06-112014-06-112014-06-11201410.5075/epfl-thesis-6262https://infoscience.epfl.ch/handle/20.500.14299/104163urn:nbn:ch:bel-epfl-thesis6262-7entransmission electron microscopydiffraction contrast imageimage stress effectanisotropydislocation loopcolumn approximationCUFOURSchaeublin-Stadelmann equationsFree surface effects in TEM imaging of dislocation lines and loops in Fethesis::doctoral thesis