[Correction] High carrier mobility along the [111] orientation in Cu<sub>2</sub>O photoelectrodes (vol 628, pg 765, 2024)

Pan, LinfengDai, LinjieBurton, Oliver J.Chen, LuAndrei, VirgilZhang, YouchengRen, DanCheng, JinshuiWu, LinxiaoFrohna, KyleAbfalterer, AnnaYang, Terry Chien-JenNiu, WenzheXia, MengHofmann, StephanDyson, Paul J.Reisner, ErwinSirringhaus, HenningLuo, JingshanHagfeldt, AndersGraetzel, MichaelStranks, Samuel D.2025-03-262025-03-262025-03-262024-05-2310.1038/s41586-024-07489-8https://infoscience.epfl.ch/handle/20.500.14299/248269WOS:00143755820000738720087EnglishScience & Technology[Correction] High carrier mobility along the [111] orientation in Cu<sub>2</sub>O photoelectrodes (vol 628, pg 765, 2024)text::journal::journal article