Moret, J.-M.Anton, M.Barry, S.Behn, R.Besson, G.Buhlmann, F.Burri, A.Chavan, R.Corboz, M.Deschenaux, C.Dutch, M. J.Duval, B. P.Fasel, D.Favre, A.Franke, S.Hirt, A.Hofmann, F.Hollenstein, C.Isoz, P.-F.Joye, B.Lister, J. B.Llobet, X.Magnin, J.-C.Mandrin, P.Marletaz, B.Marmillod, P.Martin, Y.Mayor, J.-M.Moravec, J.Nieswand, C.Paris, P. J.Perez, A.Pietrzyk, Z. A.Piffl, V.Pitts, R. A.Pochelon, A.Sauter, O.Toledo, W. VanTonetti, G.Tran, M. Q.Troyon, F.Ward, D. J.Weisen, H.2008-04-162008-04-162008-04-16199510.1088/0741-3335/37/11A/014https://infoscience.epfl.ch/handle/20.500.14299/21321WOS:A1995TM95300015Ohmic H-mode and confinement in TCVtext::journal::journal article::research article