Dändliker, R.Zimmermann, E.Frosio, G.2009-04-222009-04-222009-04-22199210.1109/OFS.1992.762959https://infoscience.epfl.ch/handle/20.500.14299/37573Noise-resistant signal processing for electronically scanned white-light interferometrytext::conference output::conference proceedings::conference paper