Soubies, EmmanuelUnser, Michael2019-06-182019-06-182019-06-182019-06-0110.1109/TCI.2018.2887136https://infoscience.epfl.ch/handle/20.500.14299/156910WOS:000467570400006While structured-illumination microscopy (SIM) is inherently a three-dimensional (3-D) technique, many biological questions can be addressed from the acquisition of a single focal plane with high lateral resolution. Unfortunately, the single-slice reconstruction of thick samples suffers from defocusing. In this paper, however, we take advantage of a 3-D model of the acquisition system to derive a reconstruction method out of a single two-dimensional (2-D) SIM measurement. It enables the estimation of the out-of-focus signal and improves the quality of the reconstruction, without the need of acquiring additional slices. The proposed algorithm relies on a specific formulation of the optimization problem together with the derivation of computationally efficient proximal operators. These developments allow us to deploy an efficient inner-loop-free alternating-direction method of multipliers (ADMM), with guaranteed convergence.Engineering, Electrical & ElectronicImaging Science & Photographic TechnologyEngineeringImaging Science & Photographic Technologystructured-illumination microscopysuper-resolutionreconstruction algorithmsinner-loop-free admmproximal operatorspatterned excitation microscopyfield fluorescence microscopyimage-reconstructionlateral resolutioninversetext::journal::journal article::research article