Welnak, J.Dong, Z.Solak, H.Wallace, J.Cerrina, F.Bertolo, M.Bianco, A.Difonzo, S.Fontana, S.Jark, W.Mazzolini, F.Rosei, R.Savoia, A.Underwood, J. H.Margaritondo, G.2006-10-032006-10-032006-10-03199510.1063/1.1145662https://infoscience.epfl.ch/handle/20.500.14299/234695WOS:A1995QK98100296SuperMAXIMUM: A Schwarzschild-based, spectromicroscope for ELETTRAtext::journal::journal article::research article