Lang, T.Thévenaz, LucRen, Z. B.Robert, Ph2008-09-292008-09-292008-09-291993https://infoscience.epfl.ch/handle/20.500.14299/29858One of the most important parameters in the characterization of integrated optical waveguides is the precise determination of the effective cut-off wavelength of the fundamental and the first order mode, since it sets the exact region of single-mode operation. This paper describes an experimental set-up for the measurement of the cut-off wavelengths of integrated optical waveguides, using the technique of spectral light transmission. Measurement results obtained with Ti:LiNbO3 channel waveguides are presented. The effect of different geometrical parameters and fabrication conditions on the cut-off wavelengths of the channel waveguides for both TE and TM mode excitation will be discussed.Cut-off wavelength measurements of integrated optical waveguidestext::journal::journal article::research article