Quantitative refractive index micro-tomography with Digital Holographic Microscopy: an efficient tool for metrology in nanotechnology and life sciences

Charrière, FlorianPavillon, NicolasColomb, TristanCuche, EtienneEmery, YvesMarquet, PierreRappaz, BenjaminDepeursinge, Christian2009-07-202009-07-202009-07-202006https://infoscience.epfl.ch/handle/20.500.14299/41597[MVD]Quantitative refractive index micro-tomography with Digital Holographic Microscopy: an efficient tool for metrology in nanotechnology and life sciencestext::conference output::conference proceedings::conference paper