Margaritondo, G.2006-10-032006-10-032006-10-03199210.12693/APhysPolA.82.283https://infoscience.epfl.ch/handle/20.500.14299/234564WOS:A1992JT09500009Progress in the instrumentation and, in particular, in the photon sources makes it possible to implement a number of established X-ray spectroscopies in a high-lateral-resolution mode. We discuss the general trends of this field, and then we present a detailed analysis of a particular and very interesting branch: photoemission spectromicroscopy. The results include a recent world record in lateral and energy resolution, obtained by the MAXIMUM system at Wisconsin, and microimages of materials science systems as well as of neuron networks.SCANNING PHOTOELECTRON MICROSCOPEPHOTOEMISSION SPECTROMICROSCOPYSYNCHROTRON RADIATIONNEURON NETWORKSRESOLUTIONMAXIMUMSILICONtext::journal::journal article::research article