Gautsch, S.Akiyama, T.de Rooij, N. F.Staufer, U.Niedermann, P.Howald, L.Müller, D.Tonin, A.Hidber, H.-R.Pike, W. T.Hecht, M. H.2009-05-122009-05-122009-05-122000https://infoscience.epfl.ch/handle/20.500.14299/39279Atomic force microscope for planetary applicationstext::conference output::conference proceedings::conference paper