Aguet, FrançoisGeissbühler, StefanMärki, IwanLasser, TheoUnser, Michael2009-10-272009-10-272009-10-27200910.1117/12.831488https://infoscience.epfl.ch/handle/20.500.14299/43905We introduce an efficient, image formation model-based algorithm that extends super-resolution fluorescence localization to include orientation estimation, and report experimental accuracies of 5 nanometers for position estimation and 2 degrees for dipole orientation estimation.text::conference output::conference proceedings::conference paper