Kim, Myun-SikScharf, ToralfAssafrao, Alberto C.Pereira, Silvania F.Urbach, PaulHerzig, Hans Peter2013-01-212013-01-212013-01-212013https://infoscience.epfl.ch/handle/20.500.14299/87984The non-diverging feature of the Bessel-kind beam leads to multiple phase anomalies along the optical axis in contrary to the focused Gaussian beam. Here, we analyze the phase distributions using in a longitudinal-differential phase mode of a high-resolution interference microscope. The measured data are compared with rigorous simulations, showing an excellent agreement.Singular opticsPhase shiftPhase measurementMultiple Phase Anomalies in Bessel Beamtext::conference output::conference paper not in proceedings