Märki, IwanGeissbühler, StefanAguet, FrançoisBilenca, AlbertoLasser, Theo2009-07-232009-07-232009-07-232009https://infoscience.epfl.ch/handle/20.500.14299/41785We demonstrate nanometer-level localization accuracy of a single fluorescent emitter in three dimensions. Our super resolution microscopy technique is based on spectral self-interference for axial localization and two-dimensional diffraction pattern analysis for lateral localization.text::conference output::conference presentation