Leitgeb, R. A.Villiger, M.Bachmann, A. H.Steinmann, L.Lasser, T.2008-02-252008-02-25200610.1364/OL.31.002450https://infoscience.epfl.ch/handle/20.500.14299/18986WOS:000240008400024We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.(110.4500) Imaging systemsOptical coherence tomography(170.3880) Medical optics and biotechnologyMedical and biological imaging(170.6900) Medical optics and biotechnologyThree-dimensional microscopyExtended focus depth for Fourier domain optical coherence microscopytext::journal::journal article::research article