Munteanu, D.Ionescu, A. M.2007-10-102007-10-102007-10-10200210.1109/TED.2002.1013276https://infoscience.epfl.ch/handle/20.500.14299/12745WOS:000176532900015441Modeling of drain current overshoot and recombination lifetime extraction in floating-body submicron SOI MOSFETstext::journal::journal article::research article