Janchen, G.Hoffmann, P.Kriele, A.Lorenz, H.Kulik, A. J.Dietler, G.2007-06-202007-06-202007-06-20200210.1063/1.1485307https://infoscience.epfl.ch/handle/20.500.14299/9079WOS:000176128100048Mechanical properties of high-aspect-ratio atomic-force microscope tipstext::journal::journal article::research article