Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology

Coustans, MathieuJazaeri, FarzanEnz, ChristianKrummenacher, FrancoisKayal, MaherMeyer, ReneAcovic, AlexandreHabas, PredragLolivier, JeromeBucher, Matthias2017-08-022017-08-022017-08-02201710.1109/ICNF.2017.7985953https://infoscience.epfl.ch/handle/20.500.14299/139510Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technologytext::conference output::conference proceedings::conference paper