Axial sub-nanometer accuracy in digital holographic microscopy

Kühn, J.Charrière, F.Colomb, T.Cuche, EtienneMontfort, F.Emery, YvesMarquet, P.Depeursinge, Christian2009-07-202009-07-202009-07-20200810.1088/0957-0233/19/7/074007https://infoscience.epfl.ch/handle/20.500.14299/41650WOS:00025690780000812942[MVD]Axial sub-nanometer accuracy in digital holographic microscopytext::journal::journal article::research article